Electron microscopes and sample preparation equipment – Divided Cont Toggle

Electron microscopes

FEI Helios NanoLab 660 G3 UC

JEOL JEM 2100-Plus 200kV

Sample preparation equipment

Automatic Plunge Freezer EM GP2

Leica EM HPM100 – high pressure freezing machine

Leica EM ACE600 – coating system

Leica EM CPD300 – critical point dryer

Leica EM AFS2 & FSP (freeze substitution processor)

Leica EM AFS2 (automatic freeze substitution)

Pelco BioWavePro+ – microwave processor

Ultramicrotome Leica EM UC7