Equipment for electron microscopy

FEI Helios NanoLab 660 G3 UC
JEOL JEM 2100-Plus 200kV
Leica EM HPM100 – high pressure freezing machine
Leica EM ACE600 – coating system
  • precise coating of samples foe subsequent examination with an electron microscope
  • glow discharge
  • freeze fracture cryo set
  • technical specifications [PDF]
Leica EM CPD300 – critical point dryer
Leica EM FSP - freeze substitution processor
Leica EM AFS2 – automatic freeze substitution